I-RF Durable Low Insertion Loss Wafer Test Probes

1. Ukuhlolwa kwesekhethi ye-RF:
Ama-RF probes angaxhunywa endaweni yokuhlola yesekethe ye-RF, ngokulinganisa i-amplitude, isigaba, imvamisa kanye neminye imingcele yesiginali ukuze kuhlolwe ukusebenza nokuzinza kwesekhethi. Ingasetshenziselwa ukuhlola isikhulisi samandla e-RF, isihlungi, i-mixer, isikhulisi namanye amasekhethi e-RF.
2. Ukuhlolwa kwesistimu yokuxhumana okungenantambo:
I-RF probe ingase isetshenziselwe ukuhlola izinto zokuxhumana ezingenantambo, ezifana nomakhalekhukhwini, amarutha e-Wi-Fi, amadivaysi e-Bluetooth, njll. Ngokuxhuma i-RF probe embotsheni yothi yocingo, amapharamitha afana namandla okudlulisa, ukuthola ukuzwela, kanye nemvamisa. ukuchezuka kungalinganiswa ukuze kuhlolwe ukusebenza kwedivayisi futhi kuqondise ukulungisa amaphutha nokulungiselelwa kwesistimu.
3. Ukuhlolwa kwe-antenna ye-RF:
I-RF probe ingasetshenziswa ukukala izici zemisebe ye-antenna kanye ne-impedance yokufaka. Ngokuthinta i-RF probe esakhiweni sezimpondo, i-VSWR yothi (isilinganiso segagasi lokuma kwe-voltage), imodi yemisebe, inzuzo kanye namanye amapharamitha angakalwa ukuze kuhlolwe ukusebenza kothi futhi kwenziwe ukwakheka nokwenza kahle kothi.
4. Ukuqapha isignali ye-RF:
I-RF probe ingasetshenziswa ukuqapha ukudluliswa kwamasignali e-RF ohlelweni. Ingasetshenziselwa ukubona ukuncishiswa kwesignali, ukuphazamiseka, ukucabanga nezinye izinkinga, ukusiza ukuthola nokuxilonga amaphutha ohlelweni, futhi iqondise umsebenzi ohambisanayo wokunakekela nokususa amaphutha.
5. Ukuhlolwa kokuhambisana kwe-electromagnetic (EMC):
Ama-RF probes angasetshenziswa ukwenza izivivinyo ze-EMC ukuze kuhlolwe ukuzwela kwemishini kagesi ekuphazamisekeni kwe-RF endaweni ezungezile. Ngokubeka i-RF probe eduze kwedivayisi, kungenzeka ukulinganisa impendulo yocingo ezinkambini ze-RF zangaphandle futhi uhlole ukusebenza kwayo kwe-EMC.